Improving Encoding Efficiency in Test Compression using Sequential Linear Decompressors with Retained Free Variables APPROVED BY SUPERVISING COMMITTEE:

Align-Encode Delay Assignment in the Case of XOR-Decompressors: Impact of Parallel Computations

Various techniques can be used to reduce the test time and cost of chip development, some of which achieve their objective by reducing the test data volume through the implementation of compression technologies such as XOR-based decompressors. In the presence of XOR decompressor, the delivery of acceptable (encodable) test patterns might not be possible. The AlignEncode technique which manipula...

Java Memory Compression Approved by Supervising Committee

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Ratchet: A Prototype Change-Impact Analysis Tool with Dynamic Test Selection for C++ Code APPROVED BY SUPERVISING COMMITTEE:

Evaluating Fabric Pilling/Wrinkling Appearance Using 3D Images APPROVED BY SUPERVISING COMMITTEE:

Efficient Test Data Compression Techniques using Viterbi Architecture

This paper presents the long data compression and the Cmos transistor count increased new fault technologies theses data compression the large data compression and storing the data are described, for provides high encoding efficiency and scalability with respect to the number of test channels support test channel the support algorithm is Viterbi-based test compression. Instead of using the line...